Topics and Keywords

  1. Emerging Devices, Logic, and Memory Technology
  2. High Frequency, Power Devices and Circuits, and Compound Semiconductor Technology
  3. Novel Materials and Devices Characterization
  4. MEMS, Sensors, Package, and Heterogeneous Integration Technology
  5. Optoelectronics Devices and Silicon Photonics Technology

Topics

Keywords

Emerging Devices, Logic and Memory Technology

FinFET, GAA, and  nanosheet based devices; 2D and devices on low-dimensional materials; BEOL compatible transistors; Spintronic and magnetic devices; Novel cryogenic devices; Quantum computing devices; Conventional memories; Emerging memories; 3D memory technologies; Memories for AI and near-memory computing applications; CMOS platform technologies, Advanced, novel process integration schemes and scaling approaches; Sequential, monolithic 3D integration; Memory-Logic 3D stacking

High Frequency, Power Devices and Circuits, and Compound Semiconductor Technology

Compound semiconductor materials and devices; high-electron mobility transistors (HEMTs); heterojunction bipolar transistors (HBTs); heterostructures; monolithic integration; E/D-mode; epitaxy technology; thermal management;  power ICs; power device characterization, modeling, simulation and reliability; high-frequency devices and circuits; MMICs; RFICs; millimeter-wave, sub-THz, and THz integrated circuits; antenna theory, design and measurement; MIMO antennas; beamforming and multi-beam systems.

Novel Materials and Devices Characterization

Scanning electron microscopy (SEM); Scanning probe microscopy (SPM); Transmission electron microscopy (TEM) with selected area diffraction pattern (SADP); X-ray diffraction (XRD); Auger electron spectrometer (AES); X-ray photoelectron spectroscopy (XPS); Secondary Ion Mass Spectroscopy (SIMS); Fourier-transform infrared spectroscopy (FTIR); Raman spectroscopy; atom probe tomography (APT); Nano-indentation, Spreading resistance profiling (SRP); Hall effect Measurement; Differential Hall Effect Metrology (DHEM); Device reliability; Hot carrier phenomena; Bias temperature instability; Charge trapping; Thermal effect; Flicker noise; RTN; Dielectric breakdown; Failure analysis; Electromigration; Device dynamic characterization; Parameter extraction method

MEMS, Sensors, Package and Heterogeneous Integration Technology

MEMS devices and systems; Physical and biochemical integrated sensors; Bio-electronic interfaces and implantable devices; Energy harvesting and Flexible devices; Heterogeneous Integration; Wafer-Level Packaging; Fan-Out Packaging; Fan-Out Wafer-Level Packaging(FOWLP); 2.5D/3D Packaging; Silicon Interposer; Through-Silicon Via(TSV); Micro Bump; High-Density Interconnect(HDI); System-in-Package(SiP); Artificial Intelligence(AI); Internet of Things(IoT); High-Performance Computing(HPC); Chiplet; Chip-to-Chip; Chip-to-Wafer; Hybrid Bonding; 3D Stacking; Accelerometer; Gyroscope; Magnetometer; Biosensor; Microfluidics; Microelectromechanical Actuator

Optoelectronics Devices and Silicon Photonics Technology

Advances in metamaterials, plasmonics, quantum materials and devices; optical design, testing, and engineering; optical information processing and holography; optical trapping; optical sensing; organic photonics; thin film and photovoltaic technology; biophotonics and biomedical imaging; display and solid state lighting; metaverse photonics; energy-conversion devices; silicon photonics; signal and image processing, photonic devices and applications, remote sensing; laser technology